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목록fault-localization (1)
heechan.yang
Authors: Sunmin Kang, Gabin An, Shin Yoo (KAIST) [1] NotesThis paper presents autoFL which is an automatic fault localization tool that leverages LLM and meta-data of target subject such as failing test case and its (class, method) coverage with code snippets and comments. Not only does autoFL provide the identified location of the fault within the program code (which SBFL and MBFL techniques fo..
Research Papers
2024. 7. 13. 18:06